首页> 外文OA文献 >Optical contrast determination of the thickness of SiO2 film on Si substrate partially covered by two-dimensional crystal flakes

【2h】

Optical contrast determination of the thickness of SiO2 film on Si substrate partially covered by two-dimensional crystal flakes

机译：光学对比法确定部分覆盖有二维晶体薄片的Si衬底上SiO2膜的厚度

代理获取

本网站仅为用户提供外文OA文献查询和代理获取服务，本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文，但由于OA文献来源多样且变更频繁，仍可能出现获取不到、文献不完整或与标题不符等情况，如果获取不到我们将提供退款服务。请知悉。

页面导航

著录项
相似文献
相关主题

著录项

作者
Yan Lu; Xiao-Li Li; Xin Zhang; Jiang-Bin Wu; Ping-Heng Tan;
展开▼
作者单位

展开▼
年度 2015
总页数
原文格式 PDF
正文语种英语
中图分类

相似文献

外文文献
中文文献
专利

1. Thickness identification of atomically thin InSe nanoflakes on SiO2/Si substrates by optical contrast analysis [J] . Brotons-Gisbert M., Sanchez-Royo J. F., Martinez-Pastor J. P. Applied Surface Science . 2015,第NOVa1PTaB期

机译：通过光学对比分析确定SiO2 / Si基体上原子薄的InSe纳米薄片的厚度
2. Optical properties of ZnO thin films obtained by heat treatment of Zn thin films on amorphous SiO2 substrates and single crystalline GaSe lamellas [J] . Caraman Iuliana, Dmitroglo Liliana, Evtodiev Igor, Thin Solid Films . 2016,第ptaB期

机译：通过在非晶SiO2衬底和单晶GaSe薄片上热处理Zn薄膜获得的ZnO薄膜的光学特性
3. DETERMINATION OF THICKNESS, REFRACTIVE INDICES, OPTICAL ANISOTROPY OF, AND STRESSES IN SIO2 FILMS ON SILICON WAFERS [J] . Lukosz W., Pliska P. Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter . 1995,第1a2期

机译：硅晶片上SIO2膜的厚度，折射率，光学各向异性和应力的测定
4. Determination of optical constants and thickness ofcrystalline SrxBa1-xNb2O6 thin films by single transmissionmeasurement [C] . Weidong Shen, Xu Liu, Zhiru Shen, Optical interference coatings: technical digest . 2004

机译：单透射法测定SrxBa1-xNb2O6晶体薄膜的光学常数和厚度
5. Non-Prestonian RRs of poly-Si and SiO2 Films and Effect of Residual Stress on RRs of Various Types of SiO2 and Si 3N4 Films. [D] . Korkmaz, Sevim. 2017

机译：多晶硅和SiO2薄膜的非Prestonian RRs和残余应力对各种类型的SiO2和Si 3N4薄膜的RRs的影响。
6. Optical and Structural Properties of Si Nanocrystals in SiO2 Films [O] . Timur Nikitin, Leonid Khriachtchev 2015

机译：SiO2薄膜中Si纳米晶体的光学和结构性质
7. Effect of thickness and substrate temperature on structure and optical band gap of hot wall-deposited $CuInSe_{2}$ polycrystalline thin films [O] . Agilan S, Mangalaraj D, Narayandass Sa K, 2005

机译：厚度和衬底温度对热壁沉积$ CuInSe_ {2} $多晶薄膜结构和光学带隙的影响
8. Zone-Melting Recrystallization of 3 inch Diameter Si Films on SiO2 -coated Si Substrates [R] . Fan, J. C. C., Tsaur, B. Y., Chapman, R. L., 1982

机译：在siO2涂覆的si衬底上3英寸直径si薄膜的区域熔融重结晶

Optical contrast determination of the thickness of SiO2 film on Si substrate partially covered by two-dimensional crystal flakes

著录项

相似文献

相关主题

期刊订阅